Proceedings of the 27th National and 5th International ISHMT-ASTFE Heat and Mass Transfer Conference December 14-17, 2023, IIT Patna, Patna-801106, Bihar, India
Thickness Profile Measurement of a Nanofluid Thin Film Meniscus using Reflectometry
Resumo
The thin film meniscus is formed in vapor chambers, thermosiphons, capillary pump loops, micro-heat pipes employed for cooling of the micro-structured devices such as micro-electro-mechanical devices (MEMS) and integrated circuits. The precinct of the micro region of a liquid film meniscus harboring the bemusing potential for high heat flux is an accentuating domain for the researchers. Thus, it pulls our
attention towards experimental investigation to unravel the
factual observation from the theoretical assumptions. The
existing work experimentally investigates the effect of the
inclusion of nanoparticles in the working liquid explicitly on
the thickness profile of an extended meniscus region consisting
of an adsorbed region and the transition region. The immediate
influence of different volumetric concentrations (φv=0.01%, 0.02%, and 0.03%) of aluminium oxide (Al2O3) nanoparticles
in water (polar liquid solvent) has been propounded. A panoramic discussion exploring the ascertained observation of
thickness with a novel insight of the nanoparticles behaving
similar to the extent of nanoscale roughness in the adsorbed
layer has been suggested. The increase in the adsorbed layer
thickness leads to the suppression of peak curvature at the
transition region with increasing volumetric concentration.
Therefore, it is established that the pressure gradient driving the liquid flow towards the transition region for replenishment
decreases.