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Proceedings of the 27th National and 5th International ISHMT-ASTFE Heat and Mass Transfer Conference December 14-17, 2023, IIT Patna, Patna-801106, Bihar, India
December, 14-17, 2023, Bihar, India

Exploring the Potential of Thermal Avalanche in Resistive Switching Memory

Get access (open in a dialog) DOI: 10.1615/IHMTC-2023.1660
pages 1023-1025


Joule heating-driven thermal dissolution of conductive filament (CF) is a vastly explored mechanism for the reset process in resistive switching (RS) phenomena. Here, we studied the possibility of thermal avalanche by a simple model compatible with experimental data of a bipolar RS device of LaMnO3 and Cu2S composites. Different critical voltages (Vc) are found for all samples, after which the avalanche process begins. Calculated power loss at critical voltages is very similar, corresponding to a unique critical temperature (Tc). The trend of the coefficient of exponent and reset voltage (Vreset) with Cu2S concentration shows a deep connection between them and with oxygen vacancy concentration.