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Proceedings of the 27th National and 5th International ISHMT-ASTFE Heat and Mass Transfer Conference December 14-17, 2023, IIT Patna, Patna-801106, Bihar, India
December, 14-17, 2023, Bihar, India

Thickness Profile Measurement of a Nanofluid Thin Film Meniscus using Reflectometry

Get access (open in a dialog) DOI: 10.1615/IHMTC-2023.400
pages 241-246


The thin film meniscus is formed in vapor chambers, thermosiphons, capillary pump loops, micro-heat pipes employed for cooling of the micro-structured devices such as micro-electro-mechanical devices (MEMS) and integrated circuits. The precinct of the micro region of a liquid film meniscus harboring the bemusing potential for high heat flux is an accentuating domain for the researchers. Thus, it pulls our attention towards experimental investigation to unravel the factual observation from the theoretical assumptions. The existing work experimentally investigates the effect of the inclusion of nanoparticles in the working liquid explicitly on the thickness profile of an extended meniscus region consisting of an adsorbed region and the transition region. The immediate influence of different volumetric concentrations (φv=0.01%, 0.02%, and 0.03%) of aluminium oxide (Al2O3) nanoparticles in water (polar liquid solvent) has been propounded. A panoramic discussion exploring the ascertained observation of thickness with a novel insight of the nanoparticles behaving similar to the extent of nanoscale roughness in the adsorbed layer has been suggested. The increase in the adsorbed layer thickness leads to the suppression of peak curvature at the transition region with increasing volumetric concentration. Therefore, it is established that the pressure gradient driving the liquid flow towards the transition region for replenishment decreases.